With transmission electron microscopy (TEM) we study materials at high magnification and an ultimate resolution of 1.4 Å. The atomic lattice spacings in the material crystals can be observed in high resolution TEM images and from electron diffraction in the TEM. TEM therefore offer the possibility of studying the size, shape and crystal structure of nano-scaled objects. Information about the sample composition at the nanoscale is also provided either from characteristic x-ray signals emitted from the sample or from characteristic energy losses from the electrons transmitted through the sample.

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