- Status Operational
- Availability Commercial
We have developed unique Controlled Atmosphere High Temperature Scanning Probe Microscopes which are capable of performing in operando surface studies at up to 850 °C in a controlled atmosphere. A fine probe is scanned over the surface while acquiring topographic and electrical information. The available modes are contact and tapping mode topography, surface conductance, scanning tunneling microscopy (STM) and Kelvin probe microscopy. Local electrochemical impedance spectroscopy (EIS) and scanning tunneling spectroscopy (STS) can be performed in selected points.